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Modern methods of investigation of real structure of the materials for micro- and nanosystem engineering
Major: Micro- and nanoelectronic instruments and devises
Code of Subject: 7.153.02.O.3
Credits: 6
Department: Semiconductor Electronics
Lecturer: Dr.Sc., Prof. Leonid O. Vasylechko
Semester: 1 семестр
Mode of Study: денна
Learning outcomes:
As result of discipline learning the student has to:
- know of foundation of the interaction of synchrotron, neutron and X-ray radiations with substances;
- know and understand the modern lines of development of the methods for compositional and structural investigation of the materials;
- be able to choose the optimal methods for the study of crystal structure and structural perfection of real crystals;
- use the main computer programs for the study of phase composition and structure of the materials.
- know of foundation of the interaction of synchrotron, neutron and X-ray radiations with substances;
- know and understand the modern lines of development of the methods for compositional and structural investigation of the materials;
- be able to choose the optimal methods for the study of crystal structure and structural perfection of real crystals;
- use the main computer programs for the study of phase composition and structure of the materials.
Required prior and related subjects:
- prerequisites: Crystallophysics; Interaction of electromagnetic radiation with the materials for micro-nanosystem engineering
- co-requisites: Materials and elements for laser medical systems and detectors of radiations.
- co-requisites: Materials and elements for laser medical systems and detectors of radiations.
Summary of the subject:
Synchrotron, neutron and X-ray radiations: sources, detectors, optics; theory of interaction of radiation with substance; peculiarities of structure examination using X-ray synchrotron and neutron radiation; crystal structure investigation and distribution of electron density; real structure of the bulk and thin-film materials; in situ low- and high temperature diffraction and structure examination at high pressure; extended X-ray absorption fine structure (EXAFS) and X-ray absorption near edge structure (XANES) techniques and their using for analysis of real crystal structure.
Recommended Books:
- Powder Diffraction. Theory and Practice. Ed.’s: R.E. Dinnebier and S.J.L. Billinge. – Cambridge, The Royal Society of Chemistry, 2008. – 582 p.
- The problems of modern crystallography. Structural investigations of crystals. – Moscow: Nauka, 1996. – 489 p. (in Russian)
- Umanskii Ya, Skokov Yu, Ivanov L, Rastorguev L. Crystallography, X-ray and electron microscopy. –Moscow: Metallurgy, 1982. –631 p. (in Russian)
- Pecharsky V.K. and Zavalij P.Y. Fundamentals of Powder Diffraction and Structural characterization of Materials. – Boston: Kluwer Academic Publishers, 2003. – 713 p.
- The problems of modern crystallography. Structural investigations of crystals. – Moscow: Nauka, 1996. – 489 p. (in Russian)
- Umanskii Ya, Skokov Yu, Ivanov L, Rastorguev L. Crystallography, X-ray and electron microscopy. –Moscow: Metallurgy, 1982. –631 p. (in Russian)
- Pecharsky V.K. and Zavalij P.Y. Fundamentals of Powder Diffraction and Structural characterization of Materials. – Boston: Kluwer Academic Publishers, 2003. – 713 p.
Assessment methods and criteria:
Current checkups (30%): laboratory reports
Final test (70%): exam (written answers and oral examination)
Final test (70%): exam (written answers and oral examination)
Modern Research Methods of Real Structure of Materials for Micro Nano Systems Engineering
Major: Micro- and nanoelectronic instruments and devises
Code of Subject: 7.153.02.O.3
Credits: 6
Department: Semiconductor Electronics
Lecturer: Dr.Sc., Prof. Leonid O. Vasylechko
Semester: 1 семестр
Mode of Study: денна
Learning outcomes:
As result of discipline learning the student has to:
- know of foundation of the interaction of synchrotron, neutron and X-ray radiations with substances;
- know and understand the modern lines of development of the methods for compositional and structural investigation of the materials;
- be able to choose the optimal methods for the study of crystal structure and structural perfection of real crystals;
- use the main computer programs for the study of phase composition and structure of the materials.
- know of foundation of the interaction of synchrotron, neutron and X-ray radiations with substances;
- know and understand the modern lines of development of the methods for compositional and structural investigation of the materials;
- be able to choose the optimal methods for the study of crystal structure and structural perfection of real crystals;
- use the main computer programs for the study of phase composition and structure of the materials.
Required prior and related subjects:
- prerequisites: Crystallophysics; Interaction of electromagnetic radiation with the materials for micro-nanosystem engineering
- co-requisites: Materials and elements for laser medical systems and detectors of radiations.
- co-requisites: Materials and elements for laser medical systems and detectors of radiations.
Summary of the subject:
Synchrotron, neutron and X-ray radiations: sources, detectors, optics; theory of interaction of radiation with substance; peculiarities of structure examination using X-ray synchrotron and neutron radiation; crystal structure investigation and distribution of electron density; real structure of the bulk and thin-film materials; in situ low- and high temperature diffraction and structure examination at high pressure; extended X-ray absorption fine structure (EXAFS) and X-ray absorption near edge structure (XANES) techniques and their using for analysis of real crystal structure.
Recommended Books:
- Powder Diffraction. Theory and Practice. Ed.’s: R.E. Dinnebier and S.J.L. Billinge. – Cambridge, The Royal Society of Chemistry, 2008. – 582 p.
- The problems of modern crystallography. Structural investigations of crystals. – Moscow: Nauka, 1996. – 489 p. (in Russian)
- Umanskii Ya, Skokov Yu, Ivanov L, Rastorguev L. Crystallography, X-ray and electron microscopy. –Moscow: Metallurgy, 1982. –631 p. (in Russian)
- Pecharsky V.K. and Zavalij P.Y. Fundamentals of Powder Diffraction and Structural characterization of Materials. – Boston: Kluwer Academic Publishers, 2003. – 713 p.
- The problems of modern crystallography. Structural investigations of crystals. – Moscow: Nauka, 1996. – 489 p. (in Russian)
- Umanskii Ya, Skokov Yu, Ivanov L, Rastorguev L. Crystallography, X-ray and electron microscopy. –Moscow: Metallurgy, 1982. –631 p. (in Russian)
- Pecharsky V.K. and Zavalij P.Y. Fundamentals of Powder Diffraction and Structural characterization of Materials. – Boston: Kluwer Academic Publishers, 2003. – 713 p.
Assessment methods and criteria:
Current checkups (30%): laboratory reports
Final test (70%): exam (written answers and oral examination)
Final test (70%): exam (written answers and oral examination)