Ви переглядаєте архівну версію офіційного сайту НУЛП (2005-2020р.р.). Актуальна версія: https://lpnu.ua

Modern Techniques in Diffractometric Methods for Materials Research

Major: Micro- and Nano-system Technology
Code of Subject: 8.153.00.O.9
Credits: 3
Department: Semiconductor Electronics
Lecturer: Leonid. O. Vasylechko, Professor, Doctor of Science, Professor at Semiconductor Electronics Department
Semester: 2 семестр
Mode of Study: денна
Learning outcomes:
– knowledge of basic methods of studying of crystal structure of substances;
– laboratory skills and ability to design and perform experimental studies, to interpret data and draw conclusions in accordance with specialization;
– the ability to solve and refine the crystal structures of materials, to systematize and compare them,
– ability to perform literature search, consult and critically use scientific databases on the crystalline structure of materials;
– understanding the need to learn bi itself during life;
– the ability to systematically monitor the development of science and technology.
Required prior and related subjects:
prerequisites: absent
co-requisites: absent
Summary of the subject:
Review of diffraction methods for the study of the structure of a solids. Interaction of X-ray, synchrotron, neutron and electron radiation with matter. X-ray structural analysis. Peculiarities of crystal structure study of materials. Implementation of the Rietveld method. Ideal and real structure of the materials. Micro- and macro-stresses in solids. The size of crystallites (nanopowders). Diffuse and low angle scattering. Features of diffraction of synchrotron and neutron radiation under extreme conditions. In situ low- and high-temperature diffraction and structure investigation of the materials at high pressures. Determination of thermal expansion parameters and nature of thermal dispacements of atoms, compression parameters and elastic characteristics of materials.
Recommended Books:
Base:
1. Modern diffraction methods. / Ed.’s: E.J. Mittermeijer, U. Welzel. ? Wiley-VCH, 2013. ? 528 p.
2. Innovative technological materials. Structural properties by neutron scattering, synchrotron radiation and modeling / Ed.’s: F. Rustichelli, J. J. Skrzypek. ? Springer, 2010. ? 279 p.
3. Local structure from diffraction / Ed.’s: S.J.L. Billinge, M.F. Thorpe. ? Kluwer Academic Publishers, 2002.
4. Pecharsky V. Fundamentals of powder diffraction and structural characterization of materials, second edition / V. Pecharsky, P. Zavalij. ? N. Y.: Springer, 2005. ? 713 p.
5. Powder Diffraction. Theory and Practice. / Ed.’s R.E. Dinnebier, S.J.L. Billinge. ? Cambridge: The Royal Society of Chemistry, 2008. ? 582 p.
6. Уманский Я. Кристаллография, рентгенография и электронная микроскопия /
Я. Уманский, Ю. Скоков, Л. Иванов, Л. Расторгуев. ? М:. Металлургия, 1982. ? 631 с.
7. Вест А. Химия твердого тела. Теория и приложения. Т.1-2 / А. Вест. ? М:. Мир, 1988.

Supplementary:
1. Зиман З.З. Основи структурної кристалографії: Навч. посібник / З.З. Зиман– Х.: ХНУ імені В.Н. Каразіна, 2008. – 212 с.
2. Мачулин Ф.В. Рентгеновская диагностика структурного совершенства слабо искаженных кристаллов / Ф.В. Мачулин, В.И. Хрупа. ? К.: Наукова думка, 1995. ? 191 с.
3. Жданов Г.С. Диффракционный и резонансный структурный анализ / Г.С. Жданов,
А.С. Иллюшин, С.В. Никитина. ? М.: Наука, 1980. ? 254 с.
4. Hammond Ch., The basics of crystallography and diffraction / Ch. Hammond. – Oxford: Oxford University Press, 1997. – 249 p.

Information resources:
1. http://www.xray.cz/ecm%2Dcd/soft/xray/ - Crystallographic freeware, shareware and links.
2. http://www.cryst.ehu.es/index.html - Bilbao crystallographic server.
3. http://www.ccp14.ac.uk/ - The Collaborative Computational Projects (CCPs), assist universities in developing, maintaining, promoting and distributing computer programs and computational methods.
4. http://www.pa.msu.edu/cmp/billinge-group/programs/discus/ - Diffuse program package consisting of three programs: DISCUS, PDFFIT and a specialized plotting program KUPLOT.
5. http://www.unf.edu/~michael.lufaso/spuds/index.html - Structure Prediction Diagnostic Software.
6. www.wincsd.eu/ - A Crystal Structure Determination and Crystallographic Calculation Software.
7. http://icdd.com/ - The International Centre for Diffraction Data.
8. http://www.icdd.com/resources/axasearch/search_based_on_vol.asp - Advances in X-ray Analysis. AXA Volumes 40-57, 59 including 1033 manuscripts in Adobe PDF Format.
Assessment methods and criteria:
Current control (30%): written reports on laboratory work, oral examination
Final control (70%, exam)