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Characterizatyon

Спеціальність: Micro- and Nano-system Technology
Код дисципліни: 8.153.00.O.8
Кількість кредитів: 3
Кафедра: Semiconductor Electronics
Лектор: Leonid. O. Vasylechko, Professor, Doctor of Science, Professor at Semiconductor Electronics Department
Семестр: 2 семестр
Форма навчання: денна
Результати навчання:
– knowledge of basic methods of studying of crystal structure of substances;
– laboratory skills and ability to design and perform experimental studies, to interpret data and draw conclusions in accordance with specialization;
– the ability to solve and refine the crystal structures of materials, to systematize and compare them,
– ability to perform literature search, consult and critically use scientific databases on the crystalline structure of materials;
– understanding the need to learn bi itself during life;
– the ability to systematically monitor the development of science and technology.
Необхідні обов'язкові попередні та супутні навчальні дисципліни:
prerequisites: absent
co-requisites: absent
Короткий зміст навчальної програми:
Review of modern methods for investigation of materials for micro- and nanosystem technique. Diffraction, microscopic and spectral methods. Peculiarities of interaction of X-ray, synchrotron, neutron and electron radiation with matter. Scatering of different kind of radiation by nanocrystals. Direct determination and refinement of crystal structure parameters of materials from diffractometric data. Full profile refinement techniques – Rietveld and Le-Bail methods. Maps of electron density distribution. Peculiarities of crystal structure investigations of nanoscaled material. Ideal and real structure of the materials. Micro- and macro-stresses in solids. The size and morphology of crystallites (nanopowders). Defect in crystals and nonstoichiometry. X-ray topography using synchrotron radiation and neutrons. Basics of termogravimetry and dilatomery. Structural phase transitions. Peculiarities of thermal expansion of nanostructurel materials. Investigation of materials under extreme conditions. In situ low- and high-temperature diffraction and structure investigation of the materials at high pressures. Determination of thermal expansion parameters and nature of thermal dispacements of atoms, compression parameters and elastic characteristics of materials. Construction of phase diagrams and equations of states.
Рекомендована література:
Base
1. Powder Diffraction. Theory and Practice. / Ed.’s R.E. Dinnebier, S.J.L. Billinge. ? Cambridge: The Royal Society of Chemistry, 2008. - 582 p.
2. Innovative technological materials. Structural properties by neutron scattering, synchrotron radiation and modeling / Ed.’s: F. Rustichelli, J. J. Skrzypek. ? Springer, 2010. - 279 p.
3. Modern diffraction methods. / Ed.’s: E.J. Mittermeijer, U. Welzel. -Wiley-VCH, 2013.?528 p.
3. Pecharsky V. Fundamentals of powder diffraction and structural characterization of materials, second edition / V. Pecharsky, P. Zavalij. - N. Y.: Springer, 2005. - 713 p.
4. 5. Local structure from diffraction / Ed.’s: S.J.L. Billinge, M.F. Thorpe. - Kluwer Academic Publishers, 2002.
6. Вест А. Химия твердого тела. Теория и приложения. Т.1-2 / А. Вест. - М:. Мир, 1988.

Supplementary

1. Зиман З.З. Основи структурної кристалографії: Навч. посібник / З.З. Зиман– Х.: ХНУ імені В.Н. Каразіна, 2008. – 212 с.
2. Мачулин Ф.В. Рентгеновская диагностика структурного совершенства слабо искаженных кристаллов / Ф.В. Мачулин, В.И. Хрупа. - К.: Наукова думка, 1995. - 191 с.
4. B. Fahlman. Materials Chemistry. Springer, 3rd edition. 2018. ISBN 978-94-024-1255-0

Information resources

1. http://pd.chem.ucl.ac.uk/pd/welcome.htm - Courses on powder diffraction online. Open Access Version of the Powder Diffraction Course.
2. http://www.crystallography.net/cod/ - Crystallography Open Database. Open-access collection of crystal structures of organic, inorganic, metal-organics compounds and minerals, excluding biopolymers
3. https://ocw.mit.edu/courses/materials-science-and-engineering/ - MIT OpenCourceWare (OCW) – бібліотека відкритих ліцензійних навчальних матеріалів Массачусетського Технологічного Інституту.
4. http://www.xray.cz/ecm%2Dcd/soft/xray/ - Crystallographic freeware, shareware and links.
5. http://www.cryst.ehu.es/index.html - Bilbao crystallographic server.
6. http://www.ccp14.ac.uk/ - The Collaborative Computational Projects (CCPs), assist universities in developing, maintaining, promoting and distributing computer programs and computational methods.
7. www.wincsd.eu/ - A Crystal Structure Determination and Crystallographic Calculation Software.
8. https://www.ill.eu/sites/fullprof/ - FullProf Suite. Crystallographic tools for Rietveld, profile matching and integrated intensity refinements of X-Ray and/or neutron data.
9. http://icdd.com/ - The International Centre for Diffraction Data.
10. http://www.icdd.com/resources/axasearch/search_based_on_vol.asp - Advances in X-ray Analysis. AXA Volumes 40-57, 59 including 1033 manuscripts in Adobe PDF Format.
11. http://www.pa.msu.edu/cmp/billinge-group/programs/discus/ - Diffuse program package consisting of three programs: DISCUS, PDFFIT and a specialized plotting program KUPLOT.
12. http://www.unf.edu/~michael.lufaso/spuds/index.html - Structure Prediction Diagnostic Software.
13. http://www.nbuv.gov.ua/ - бібліотека ім. В. Вернадського.
Методи і критерії оцінювання:
Current control (30%): written reports on laboratory work, oral examination
Final control (70%, exam)